Material Characterizations

• Morphologies: OM, SEM, TEM, HIM, AFM

• Structural aspect: HRTEM, SAED, XRD, STEM, BET

• Compositions & chemistry: EDX, XPS, EELS

• Functional Groups: FTIR and Raman

• Analytic chemistry: GC, HPLC, GC-MS, and NMR

As a materials scientist, I characterize materials from different perspectives to reveal the structure-properties relationship: Morphologies, Crystallographic Structure & Microstructure, Elemental Composition & Chemical States, and Functional Groups.

I am trained in performing optics alignment & lens aberration corrections in different electron microscopes (e.g., STEM [Link], TEM, and SEM) and ion beam systems (e.g., HIM) for atomic high-resolution imaging. In addition, I am skilled at the techniques for preparing TEM samples with minimal contaminations.

I have good theoretical knowledge and experimental experience in using XPS for surface science analysis. I am able to critically evaluate the fitting results of XPS spectrums and pinpoint the flaws [ref]. I studied the oxidation states of NiMoO4 during a gradual sulfidation process [ref].